Publication detail
Noise reliability indicators for PN junction devices
HRUŠKA, P.
English title
Noise reliability indicators for PN junction devices
Type
conference paper
Language
en
Original abstract
A measurable quantity Mq, based on the noise of a PN junction microelectronic device, is introduced. Its relation with reliability of the device and furher properties are described.
English abstract
A measurable quantity Mq, based on the noise of a PN junction microelectronic device, is introduced. Its relation with reliability of the device and furher properties are described.
Keywords in English
noise, reliability, PN junction
RIV year
2001
Released
15.11.2001
Publisher
VUT Brno
Location
Vysoké učení technické v Brně, Fakulta elektrotechniky a informatiky, Ústav fyziky,Brno
ISBN
80-214-1992-X
Book
Nové trendy ve fyzice
Edition number
1
Pages count
4
BIBTEX
@inproceedings{BUT7051,
author="Pavel {Hruška},
title="Noise reliability indicators for PN junction devices",
booktitle="Nové trendy ve fyzice",
year="2001",
month="November",
publisher="VUT Brno",
address="Vysoké učení technické v Brně, Fakulta elektrotechniky a informatiky, Ústav fyziky,Brno",
isbn="80-214-1992-X"
}