Publication detail
Noise Spectroscopy of Thick Film Resistors
SEDLÁKOVÁ, V.
English title
Noise Spectroscopy of Thick Film Resistors
Type
conference paper
Language
en
Original abstract
The noise spectroscopy and non-linearity measurements of thick film layers are proposed as a diagnostic tool for prediction of possible types of failure. The characteristic measured using two resistor pastas were compared and resistor termination influence evaluated with contact noise found negligible. Correlation between long-term stability, current noise and third harmonic index was investigated.
English abstract
The noise spectroscopy and non-linearity measurements of thick film layers are proposed as a diagnostic tool for prediction of possible types of failure. The characteristic measured using two resistor pastas were compared and resistor termination influence evaluated with contact noise found negligible. Correlation between long-term stability, current noise and third harmonic index was investigated.
Keywords in English
noise, non-linearity, thick film resistors
RIV year
2001
Released
01.01.2001
Publisher
ÚFYZ FEI VUT Brno
Location
Brno
ISBN
80-214-1992-X
Book
Sborník příspěvků konference Nové trendy ve fyzice
Pages count
6
BIBTEX
@inproceedings{BUT6838,
author="Vlasta {Sedláková},
title="Noise Spectroscopy of Thick Film Resistors",
booktitle="Sborník příspěvků konference Nové trendy ve fyzice",
year="2001",
month="January",
publisher="ÚFYZ FEI VUT Brno",
address="Brno",
isbn="80-214-1992-X"
}