Publication detail

Noise Spectroscopy of Thick Film Resistors

SEDLÁKOVÁ, V.

English title

Noise Spectroscopy of Thick Film Resistors

Type

conference paper

Language

en

Original abstract

The noise spectroscopy and non-linearity measurements of thick film layers are proposed as a diagnostic tool for prediction of possible types of failure. The characteristic measured using two resistor pastas were compared and resistor termination influence evaluated with contact noise found negligible. Correlation between long-term stability, current noise and third harmonic index was investigated.

English abstract

The noise spectroscopy and non-linearity measurements of thick film layers are proposed as a diagnostic tool for prediction of possible types of failure. The characteristic measured using two resistor pastas were compared and resistor termination influence evaluated with contact noise found negligible. Correlation between long-term stability, current noise and third harmonic index was investigated.

Keywords in English

noise, non-linearity, thick film resistors

RIV year

2001

Released

01.01.2001

Publisher

ÚFYZ FEI VUT Brno

Location

Brno

ISBN

80-214-1992-X

Book

Sborník příspěvků konference Nové trendy ve fyzice

Pages count

6

BIBTEX


@inproceedings{BUT6838,
  author="Vlasta {Sedláková},
  title="Noise Spectroscopy of Thick Film Resistors",
  booktitle="Sborník příspěvků konference Nové trendy ve fyzice",
  year="2001",
  month="January",
  publisher="ÚFYZ FEI VUT Brno",
  address="Brno",
  isbn="80-214-1992-X"
}