Detail publikace
Noise Spectroscopy of Thick Film Resistors
SEDLÁKOVÁ, V.
Anglický název
Noise Spectroscopy of Thick Film Resistors
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
en
Originální abstrakt
The noise spectroscopy and non-linearity measurements of thick film layers are proposed as a diagnostic tool for prediction of possible types of failure. The characteristic measured using two resistor pastas were compared and resistor termination influence evaluated with contact noise found negligible. Correlation between long-term stability, current noise and third harmonic index was investigated.
Anglický abstrakt
The noise spectroscopy and non-linearity measurements of thick film layers are proposed as a diagnostic tool for prediction of possible types of failure. The characteristic measured using two resistor pastas were compared and resistor termination influence evaluated with contact noise found negligible. Correlation between long-term stability, current noise and third harmonic index was investigated.
Klíčová slova anglicky
noise, non-linearity, thick film resistors
Rok RIV
2001
Vydáno
01.01.2001
Nakladatel
ÚFYZ FEI VUT Brno
Místo
Brno
ISBN
80-214-1992-X
Kniha
Sborník příspěvků konference Nové trendy ve fyzice
Počet stran
6
BIBTEX
@inproceedings{BUT6838,
author="Vlasta {Sedláková},
title="Noise Spectroscopy of Thick Film Resistors",
booktitle="Sborník příspěvků konference Nové trendy ve fyzice",
year="2001",
month="January",
publisher="ÚFYZ FEI VUT Brno",
address="Brno",
isbn="80-214-1992-X"
}