Publication detail
Noise and scanning by local illumination as reliability estimation for silicon solar cells
CHOBOLA, Z. IBRAHIM, A.
Czech title
Noise and scanning by local illumination as reliability estimation for silicon solar cells
English title
Noise and scanning by local illumination as reliability estimation for silicon solar cells
Type
journal article - other
Language
en
Original abstract
This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.
Czech abstract
This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.
English abstract
This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.
Keywords in English
Solar cells, noise, homogeneity, reliability
RIV year
2001
Released
16.03.2001
ISSN
0219-4775
Journal
Fluctuation and Noise Letters
Volume
1
Number
1
Pages count
6
BIBTEX
@article{BUT40583,
author="Zdeněk {Chobola} and Ali {Ibrahim},
title="Noise and scanning by local illumination as reliability estimation for silicon solar cells",
journal="Fluctuation and Noise Letters",
year="2001",
volume="1",
number="1",
month="March",
issn="0219-4775"
}