Publication detail

Noise and scanning by local illumination as reliability estimation for silicon solar cells

CHOBOLA, Z. IBRAHIM, A.

Czech title

Noise and scanning by local illumination as reliability estimation for silicon solar cells

English title

Noise and scanning by local illumination as reliability estimation for silicon solar cells

Type

journal article - other

Language

en

Original abstract

This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.

Czech abstract

This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.

English abstract

This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.

Keywords in English

Solar cells, noise, homogeneity, reliability

RIV year

2001

Released

16.03.2001

ISSN

0219-4775

Journal

Fluctuation and Noise Letters

Volume

1

Number

1

Pages count

6

BIBTEX


@article{BUT40583,
  author="Zdeněk {Chobola} and Ali {Ibrahim},
  title="Noise and scanning by local illumination as reliability estimation for silicon solar cells",
  journal="Fluctuation and Noise Letters",
  year="2001",
  volume="1",
  number="1",
  month="March",
  issn="0219-4775"
}