Detail publikace

Noise and scanning by local illumination as reliability estimation for silicon solar cells

CHOBOLA, Z. IBRAHIM, A.

Český název

Noise and scanning by local illumination as reliability estimation for silicon solar cells

Anglický název

Noise and scanning by local illumination as reliability estimation for silicon solar cells

Typ

článek v časopise - ostatní, Jost

Jazyk

en

Originální abstrakt

This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.

Český abstrakt

This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.

Anglický abstrakt

This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.

Klíčová slova anglicky

Solar cells, noise, homogeneity, reliability

Rok RIV

2001

Vydáno

16.03.2001

ISSN

0219-4775

Časopis

Fluctuation and Noise Letters

Ročník

1

Číslo

1

Počet stran

6

BIBTEX


@article{BUT40583,
  author="Zdeněk {Chobola} and Ali {Ibrahim},
  title="Noise and scanning by local illumination as reliability estimation for silicon solar cells",
  journal="Fluctuation and Noise Letters",
  year="2001",
  volume="1",
  number="1",
  month="March",
  issn="0219-4775"
}