Detail publikace
Noise and scanning by local illumination as reliability estimation for silicon solar cells
CHOBOLA, Z. IBRAHIM, A.
Český název
Noise and scanning by local illumination as reliability estimation for silicon solar cells
Anglický název
Noise and scanning by local illumination as reliability estimation for silicon solar cells
Typ
článek v časopise - ostatní, Jost
Jazyk
en
Originální abstrakt
This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.
Český abstrakt
This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.
Anglický abstrakt
This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.
Klíčová slova anglicky
Solar cells, noise, homogeneity, reliability
Rok RIV
2001
Vydáno
16.03.2001
ISSN
0219-4775
Časopis
Fluctuation and Noise Letters
Ročník
1
Číslo
1
Počet stran
6
BIBTEX
@article{BUT40583,
author="Zdeněk {Chobola} and Ali {Ibrahim},
title="Noise and scanning by local illumination as reliability estimation for silicon solar cells",
journal="Fluctuation and Noise Letters",
year="2001",
volume="1",
number="1",
month="March",
issn="0219-4775"
}