Publication detail
Relay contacts quality screening by non-linearity tester
GRMELA, L. PAVELKA, J. HLÁVKA, J.
English title
Relay contacts quality screening by non-linearity tester
Type
conference paper
Language
en
Original abstract
The contact resistance and linearity of VA charakteristic determine a relay quality. Electric current transport through relay contacts can be considered as a charge transport by metal-insulator-metal (MIM) structure. When electric field is applied the current transport is mainly due to tunnelling and thermionic emission. For very low I-layer thickness ballistics transport can be also dominant. When gold plating contacts are made, I-layer thickness can be so small, that VA characteristic is strictly linear and third harmonic voltage is negligible.
English abstract
The contact resistance and linearity of VA charakteristic determine a relay quality. Electric current transport through relay contacts can be considered as a charge transport by metal-insulator-metal (MIM) structure. When electric field is applied the current transport is mainly due to tunnelling and thermionic emission. For very low I-layer thickness ballistics transport can be also dominant. When gold plating contacts are made, I-layer thickness can be so small, that VA characteristic is strictly linear and third harmonic voltage is negligible.
Keywords in English
third harmonic, linearity of VA characteristic, current transport
Released
13.09.2001
Publisher
VUT v Brně
Location
Brno
ISBN
80-214-1960-1
Book
Electronic Devices and Systems
Pages count
1
BIBTEX
@inproceedings{BUT3852,
author="Lubomír {Grmela} and Jan {Pavelka} and Jan {Hlávka},
title="Relay contacts quality screening by non-linearity tester",
booktitle="Electronic Devices and Systems",
year="2001",
month="September",
publisher="VUT v Brně",
address="Brno",
isbn="80-214-1960-1"
}