Detail publikace
Relay contacts quality screening by non-linearity tester
GRMELA, L. PAVELKA, J. HLÁVKA, J.
Anglický název
Relay contacts quality screening by non-linearity tester
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
en
Originální abstrakt
The contact resistance and linearity of VA charakteristic determine a relay quality. Electric current transport through relay contacts can be considered as a charge transport by metal-insulator-metal (MIM) structure. When electric field is applied the current transport is mainly due to tunnelling and thermionic emission. For very low I-layer thickness ballistics transport can be also dominant. When gold plating contacts are made, I-layer thickness can be so small, that VA characteristic is strictly linear and third harmonic voltage is negligible.
Anglický abstrakt
The contact resistance and linearity of VA charakteristic determine a relay quality. Electric current transport through relay contacts can be considered as a charge transport by metal-insulator-metal (MIM) structure. When electric field is applied the current transport is mainly due to tunnelling and thermionic emission. For very low I-layer thickness ballistics transport can be also dominant. When gold plating contacts are made, I-layer thickness can be so small, that VA characteristic is strictly linear and third harmonic voltage is negligible.
Klíčová slova anglicky
third harmonic, linearity of VA characteristic, current transport
Vydáno
13.09.2001
Nakladatel
VUT v Brně
Místo
Brno
ISBN
80-214-1960-1
Kniha
Electronic Devices and Systems
Počet stran
1
BIBTEX
@inproceedings{BUT3852,
author="Lubomír {Grmela} and Jan {Pavelka} and Jan {Hlávka},
title="Relay contacts quality screening by non-linearity tester",
booktitle="Electronic Devices and Systems",
year="2001",
month="September",
publisher="VUT v Brně",
address="Brno",
isbn="80-214-1960-1"
}