Detail publikace

Relay contacts quality screening by non-linearity tester

GRMELA, L. PAVELKA, J. HLÁVKA, J.

Anglický název

Relay contacts quality screening by non-linearity tester

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

en

Originální abstrakt

The contact resistance and linearity of VA charakteristic determine a relay quality. Electric current transport through relay contacts can be considered as a charge transport by metal-insulator-metal (MIM) structure. When electric field is applied the current transport is mainly due to tunnelling and thermionic emission. For very low I-layer thickness ballistics transport can be also dominant. When gold plating contacts are made, I-layer thickness can be so small, that VA characteristic is strictly linear and third harmonic voltage is negligible.

Anglický abstrakt

The contact resistance and linearity of VA charakteristic determine a relay quality. Electric current transport through relay contacts can be considered as a charge transport by metal-insulator-metal (MIM) structure. When electric field is applied the current transport is mainly due to tunnelling and thermionic emission. For very low I-layer thickness ballistics transport can be also dominant. When gold plating contacts are made, I-layer thickness can be so small, that VA characteristic is strictly linear and third harmonic voltage is negligible.

Klíčová slova anglicky

third harmonic, linearity of VA characteristic, current transport

Vydáno

13.09.2001

Nakladatel

VUT v Brně

Místo

Brno

ISBN

80-214-1960-1

Kniha

Electronic Devices and Systems

Počet stran

1

BIBTEX


@inproceedings{BUT3852,
  author="Lubomír {Grmela} and Jan {Pavelka} and Jan {Hlávka},
  title="Relay contacts quality screening by non-linearity tester",
  booktitle="Electronic Devices and Systems",
  year="2001",
  month="September",
  publisher="VUT v Brně",
  address="Brno",
  isbn="80-214-1960-1"
}