Publication detail

Topography and spectroscopy of a semiconductor interface

LÉTAL, P. TOMÁNEK, P.

Czech title

Topografie a spektroskopie polovodičových rozhraní

English title

Topography and spectroscopy of a semiconductor interface

Type

conference paper

Language

en

Original abstract

local topography and spectroscopy of semiconductor interfaces is introduced and studied.

Czech abstract

V článku je ukázána metodika lokální topografie a lokální spektroskopie polovodičových rozhraní.

English abstract

local topography and spectroscopy of semiconductor interfaces is introduced and studied.

Keywords in Czech

lokální spektroskopie, topografie, optika v blízkém poli

Keywords in English

local spectroscopy, near-field optics

RIV year

2004

Released

27.05.1999

Publisher

ČSSF

Location

Praha

ISBN

80-86114-27-9

Book

Photonics Prague99

Pages count

1

BIBTEX


@inproceedings{BUT7996,
  author="Petr {Létal} and Pavel {Tománek},
  title="Topography and spectroscopy of a semiconductor interface",
  booktitle="Photonics Prague99",
  year="1999",
  month="May",
  publisher="ČSSF",
  address="Praha",
  isbn="80-86114-27-9"
}