Publication detail
Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force
DRUCKMÜLLER, M. OHLÍDAL, I.
Czech title
Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force Microscopy
English title
Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force
Type
book chapter
Language
cs
RIV year
1997
Released
01.01.1994
Publisher
JOHN WILEY AND SONS
Location
CHICHESTER
ISBN
0471978272
Book
ECASIA 97
Pages count
4
BIBTEX
@inbook{BUT53494,
author="Miloslav {Druckmüller} and Ivan {Ohlídal},
title="Analysis of Single Layers Placed on Slightly Rough Surfaces by Spectroscopic Ellipsometry, Spectroscopic Reflectometry and Atomic Force Microscopy",
booktitle="ECASIA 97",
year="1994",
month="January",
publisher="JOHN WILEY AND SONS",
address="CHICHESTER",
isbn="0471978272"
}