Publication detail

Optical characterization of multilayer systems with randomly rough boundaries

OHLÍDAL, M. OHLÍDAL, I. VIŽĎA, F.

Czech title

Optická charakterizace mnohovrstevných systémů s náhodně drsnými rozhraními

English title

Optical characterization of multilayer systems with randomly rough boundaries

Type

conference paper

Language

en

Original abstract

The method based on measuring and interpeting the spectral dependences of the coherent reflectance is used to determine the values of the optical and statistical parameters of three-layer and thirteen-layer systems exhibiting the randomly rough boundaries. The systems mentioned are formed by thin films of SiO2 and TiO2.

Czech abstract

Je presentována metoda měření a interpretace spektrálních závislostí za účelem určení optických a statistických parametrů třívrstevných a třenáctivrstevných systémů s drsnými rozhraními. Systémy byly tvořeny vrstvami SiO2 a TiO2.

English abstract

The method based on measuring and interpeting the spectral dependences of the coherent reflectance is used to determine the values of the optical and statistical parameters of three-layer and thirteen-layer systems exhibiting the randomly rough boundaries. The systems mentioned are formed by thin films of SiO2 and TiO2.

Keywords in Czech

mnohovrstevné systémy, spektrální koheretní reflektometrie

Keywords in English

multilayer systems, spectroscopic reflectometry

RIV year

1999

Released

02.08.1999

Publisher

SPIE- The international Society for Optical Engine

Location

San Francisco, California, USA

ISBN

0-8194-3234-2

Book

18th Congress of the International Commission for Optics: Optics for the Next Millennium

Pages from–to

150–151

Pages count

2

BIBTEX


@inproceedings{BUT485,
  author="Ivan {Ohlídal} and František {Vižďa} and Miloslav {Ohlídal},
  title="Optical characterization of multilayer systems with randomly rough boundaries",
  booktitle="18th Congress of the International Commission for Optics: Optics for the Next Millennium",
  year="1999",
  month="August",
  pages="150--151",
  publisher="SPIE- The international Society for Optical Engine",
  address="San Francisco, California, USA",
  isbn="0-8194-3234-2"
}