Publication detail

Analysis of multiple cracks in thin coating on orthotropic substrate under mechanical and residual stresses

KOTOUL, M. ŠEVEČEK, O. PROFANT, T.

Czech title

Analysis of multiple cracks in thin coating on orthotropic substrate under mechanical and residual stresses.

English title

Analysis of multiple cracks in thin coating on orthotropic substrate under mechanical and residual stresses

Type

journal article - other

Language

en

Original abstract

The analysis addresses a typical failure development pattern in thin films consisting of a system of multiple surface cracks leading to and branching along or near the interface between the film and the base material. The process is driven by thermal residual stresses and/or mechanical loading.

Czech abstract

The analysis addresses a typical failure development pattern in thin films consisting of a system of multiple surface cracks leading to and branching along or near the interface between the film and the base material. The process is driven by thermal residual stresses and/or mechanical loading.

English abstract

The analysis addresses a typical failure development pattern in thin films consisting of a system of multiple surface cracks leading to and branching along or near the interface between the film and the base material. The process is driven by thermal residual stresses and/or mechanical loading.

Keywords in Czech

Multiple cracks, Surface layer, Interface,Thermal stresses, Matched asymptotic expansions, Reciprocal theorem

Keywords in English

Multiple cracks, Surface layer, Interface,Thermal stresses, Matched asymptotic expansions, Reciprocal theorem

RIV year

2009

Released

14.07.2009

ISSN

0013-7944

Volume

77

Number

2

Pages from–to

229–248

Pages count

20

BIBTEX


@article{BUT47786,
  author="Michal {Kotoul} and Oldřich {Ševeček} and Tomáš {Profant},
  title="Analysis of multiple cracks in thin coating on orthotropic substrate under mechanical and residual stresses",
  year="2009",
  volume="77",
  number="2",
  month="July",
  pages="229--248",
  issn="0013-7944"
}