Publication detail
Stress Testing in the Evaluation the Reliability of Electronic Devices
NOVOTNÝ, R.
Czech title
Stresové testy při hodnocení bezporuchovosti elektronických součástek
English title
Stress Testing in the Evaluation the Reliability of Electronic Devices
Type
conference paper
Language
en
Original abstract
Reliability is basically a quality parameter which must be incorporated into the product. The reliability attributes must be established already at the design phase. With increasing device complexity, reliability becomes an elusive, but significant parameter to define and achieve. It also becomes more difficult to control, demonstrate, and ensure as an operational characteristic under the projected conditions of use by the customer. This article summarizes the conceptions of the evaluation of the reliability of electronic devices.
Czech abstract
Bezporuchovost je v podstatě parametr reprezentující jakost a musí být obsažen ve výrobku. Znaky bezporuchovosti musí být ustanoveny již ve fázi kostrukce. S rostoucí složitostí součástky se bezporuchovost stává těžko postižitelným, definovatelným a dosažitelným, ale významným parametrem. Rozvněž je obtížné kontrolovat, demonstrovat a zajistit provozní charakteristiky pro projektované podmínky použití. Článek sumarizuje problémy spjaté s hodnocením spolehlivosti elektronických součástek.
English abstract
Reliability is basically a quality parameter which must be incorporated into the product. The reliability attributes must be established already at the design phase. With increasing device complexity, reliability becomes an elusive, but significant parameter to define and achieve. It also becomes more difficult to control, demonstrate, and ensure as an operational characteristic under the projected conditions of use by the customer. This article summarizes the conceptions of the evaluation of the reliability of electronic devices.
Keywords in Czech
bezporuchovost, environmentální testy, model intenzity poruch, zahoření
Keywords in English
reliability, environmental tests, hazard rate model, burn-in
RIV year
2001
Released
01.01.2001
Publisher
Ing. Zdeněk Novotný, CSc., Brno, Ondráčkova 105
Location
Crete 2001
ISBN
80-214-2027-8
Book
Socrates Workshop 2001. Intensive Training Programme in Electronic System Design. Proceedings
Edition number
1
Pages count
5
BIBTEX
@inproceedings{BUT3858,
author="Radovan {Novotný},
title="Stress Testing in the Evaluation the Reliability of Electronic Devices",
booktitle="Socrates Workshop 2001. Intensive Training Programme in Electronic System Design. Proceedings",
year="2001",
month="January",
publisher="Ing. Zdeněk Novotný, CSc., Brno, Ondráčkova 105",
address="Crete 2001",
isbn="80-214-2027-8"
}