Detail publikace
Influence of flexoelectricity on interface crack problems under a dynamic load
SLÁDEK, J. SLÁDEK, V. HRYTSYNA, M. PROFANT, T.
Anglický název
Influence of flexoelectricity on interface crack problems under a dynamic load
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
en
Originální abstrakt
In the present paper, the influence of flexoelectricity on behavior of the interface crack between two dissimilar dielectric materials under a dynamic mechanical load is investigated. The induced electric field affects the distribution and evolution of mechanical fields in dielectric materials. Large strain gradients induce the electric polarization in the direct flexoelectricity. Due to the large strain gradients at the crack tip vicinity it is needed to consider the strain gradient theory model. Governing equations in this theory contain higher-order derivatives than in the conventional continuum mechanics approach. The mixed finite element method (FEM) is developed here for a general boundary value problem, where the standard C0 continuous finite elements are applied for independent approximations of displacements and strains. The constraints between them are satisfied by collocation at appropriate internal points in elements. Interface cracks are observed in layered structures frequently due to a poor adhesion of layers. The incorporation of flexoelectricity and micro-inertial effects is needed into the failure analysis of interface cracks in nano-sized structures under dynamic loading. In numerical examples, we discuss the influence of flexoelectricity coefficients as well as the ratio of elastic coefficients and the geometrical size to microstructural (micro-stiffness and micro-inertia) length scale parameters of the bilayer composite on the crack opening displacement, stresses ahead the crack tip and induced electric intensity vector.
Anglický abstrakt
In the present paper, the influence of flexoelectricity on behavior of the interface crack between two dissimilar dielectric materials under a dynamic mechanical load is investigated. The induced electric field affects the distribution and evolution of mechanical fields in dielectric materials. Large strain gradients induce the electric polarization in the direct flexoelectricity. Due to the large strain gradients at the crack tip vicinity it is needed to consider the strain gradient theory model. Governing equations in this theory contain higher-order derivatives than in the conventional continuum mechanics approach. The mixed finite element method (FEM) is developed here for a general boundary value problem, where the standard C0 continuous finite elements are applied for independent approximations of displacements and strains. The constraints between them are satisfied by collocation at appropriate internal points in elements. Interface cracks are observed in layered structures frequently due to a poor adhesion of layers. The incorporation of flexoelectricity and micro-inertial effects is needed into the failure analysis of interface cracks in nano-sized structures under dynamic loading. In numerical examples, we discuss the influence of flexoelectricity coefficients as well as the ratio of elastic coefficients and the geometrical size to microstructural (micro-stiffness and micro-inertia) length scale parameters of the bilayer composite on the crack opening displacement, stresses ahead the crack tip and induced electric intensity vector.
Klíčová slova anglicky
Direct flexoelectricity; Gradient theory; Micro -inertia effect; A dynamic mechanical load; Induced electric potential
Vydáno
04.08.2023
Nakladatel
PERGAMON-ELSEVIER SCIENCE LTD
Místo
OXFORD
ISSN
0013-7944
Ročník
288
Číslo
4.8.2023
Strany od–do
109353–109353
Počet stran
13
BIBTEX
@article{BUT184015,
author="Ján {Sládek} and Vladimír {Sládek} and Maryan {Hrytsyna} and Tomáš {Profant},
title="Influence of flexoelectricity on interface crack problems under a dynamic load",
year="2023",
volume="288",
number="4.8.2023",
month="August",
pages="109353--109353",
publisher="PERGAMON-ELSEVIER SCIENCE LTD",
address="OXFORD",
issn="0013-7944"
}