Detail publikace
Fast low-noise transimpedance amplifier for scanning tunneling microscopy and beyond
ŠTUBIAN, M. BOBEK, J. SETVÍN, M. DIEBOLD, U. SCHMID, M.
Anglický název
Fast low-noise transimpedance amplifier for scanning tunneling microscopy and beyond
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
en
Originální abstrakt
A transimpedance amplifier has been designed for scanning tunneling microscopy (STM). The amplifier features low noise (limited by the Johnson noise of the 1 G Omega feedback resistor at low input current and low frequencies), sufficient bandwidth for most STM applications (50 kHz at 35 pF input capacitance), a large dynamic range (0.1 pA-50 nA without range switching), and a low input voltage offset. The amplifier is also suited for placing its first stage into the cryostat of a low-temperature STM, minimizing the input capacitance and reducing the Johnson noise of the feedback resistor. The amplifier may also find applications for specimen current imaging and electron-beam-induced current measurements in scanning electron microscopy and as a photodiode amplifier with a large dynamic range. This paper also discusses the sources of noise including the often neglected effect of non-balanced input impedance of operational amplifiers and describes how to accurately measure and adjust the frequency response of low-current transimpedance amplifiers.
Anglický abstrakt
A transimpedance amplifier has been designed for scanning tunneling microscopy (STM). The amplifier features low noise (limited by the Johnson noise of the 1 G Omega feedback resistor at low input current and low frequencies), sufficient bandwidth for most STM applications (50 kHz at 35 pF input capacitance), a large dynamic range (0.1 pA-50 nA without range switching), and a low input voltage offset. The amplifier is also suited for placing its first stage into the cryostat of a low-temperature STM, minimizing the input capacitance and reducing the Johnson noise of the feedback resistor. The amplifier may also find applications for specimen current imaging and electron-beam-induced current measurements in scanning electron microscopy and as a photodiode amplifier with a large dynamic range. This paper also discusses the sources of noise including the often neglected effect of non-balanced input impedance of operational amplifiers and describes how to accurately measure and adjust the frequency response of low-current transimpedance amplifiers.
Klíčová slova anglicky
THERMAL NOISE; SINGLE ATOMS; GATE NOISE; BANDWIDTH; PREAMPLIFIER; SURFACE
Vydáno
01.07.2020
Nakladatel
AMER INST PHYSICS
Místo
MELVILLE
ISSN
0034-6748
Ročník
91
Číslo
7
Strany od–do
1–11
Počet stran
11
BIBTEX
@article{BUT177312,
author="Martin {Štubian} and Juraj {Bobek} and Martin {Setvín} and Ulrike {Diebold} and Michael {Schmid},
title="Fast low-noise transimpedance amplifier for scanning tunneling microscopy and beyond",
year="2020",
volume="91",
number="7",
month="July",
pages="1--11",
publisher="AMER INST PHYSICS",
address="MELVILLE",
issn="0034-6748"
}