Detail publikace

Imaging of lattice orientation and deformations by electron channelling contrast imaging compared with low voltage imaging and EBSD

ČUPERA, J.

Anglický název

Imaging of lattice orientation and deformations by electron channelling contrast imaging compared with low voltage imaging and EBSD

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

en

Originální abstrakt

The characterization of material structure, lattice orientation or deformation structures is commonly performed by transmission electron microscopy. TEM presents some disadvantages like sample preparation, requiring extremly thin samples and reduced observation area. The coupling of electron channelling contrast imaging (ECCI) with EBSD provides an efficient substitute for TEM technique. SEM-ECCI is powerful, rapid and non destructive structural characterisation technique for imaging orientation and defects in bulk crystalline materials. This paper describes electron channelling contrast imaging of simple copper material. This is because of copper is clearly defined materials with well known structure and serves to explain the nature of phenomenon.

Anglický abstrakt

The characterization of material structure, lattice orientation or deformation structures is commonly performed by transmission electron microscopy. TEM presents some disadvantages like sample preparation, requiring extremly thin samples and reduced observation area. The coupling of electron channelling contrast imaging (ECCI) with EBSD provides an efficient substitute for TEM technique. SEM-ECCI is powerful, rapid and non destructive structural characterisation technique for imaging orientation and defects in bulk crystalline materials. This paper describes electron channelling contrast imaging of simple copper material. This is because of copper is clearly defined materials with well known structure and serves to explain the nature of phenomenon.

Klíčová slova anglicky

Channelling contrast imaging; Electron backscatter diffraction; Inverse pole figure map; Low voltage imaging; Lattice orientation

Vydáno

03.06.2016

Nakladatel

Brno University of Technology

Místo

Brno

ISBN

978-80-214-5358-6

Kniha

MULTI-SCALE DESIGN OF ADVANCED MATERIALS CONFERENCE PROCEEDINGS

Strany od–do

2–12

Počet stran

11

BIBTEX


@inproceedings{BUT130707,
  author="Jan {Čupera},
  title="Imaging of lattice orientation and deformations by electron channelling contrast imaging compared with low voltage imaging and EBSD ",
  booktitle="MULTI-SCALE DESIGN OF ADVANCED MATERIALS CONFERENCE PROCEEDINGS",
  year="2016",
  month="June",
  pages="2--12",
  publisher="Brno University of Technology ",
  address="Brno",
  isbn="978-80-214-5358-6"
}