Publication detail

Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances

OHLÍDAL, I. FRANTA, D. OHLÍDAL, M. NAVRÁTIL, K.

Czech title

Určení tloušťky a spektrálních závislostí indexu lomu neabsorbujících a slabě absorbujících tenkých vrstev pomocí vlnových délek souvisejících s extrémy ve spektrálních odrazivostech Určení tloušťky a spektrálních závislostí indexu lomu neabsorbujících a slabě absorbujících tenkých vrstev pomocí vlnových délek souvisejících s extrémy ve spektrálních odrazivostech Určení tloušťky a spektrálních závislostí indexu lomu neabsorbujících a slabě absorbujících tenkých vrstev pomocí vlnových délek souvisejících s extrémy ve spektrálních odrazivostech

English title

Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances

Type

journal article - other

Language

en

Original abstract

A new efficient modication of the method enabling us to perform the optical characterization of non-absorbing and weakly absorbing thin films without using the absolute values of reflectances measured is presented. This modification is based on determining the values of the wavelengths corresponding to the points where the spectral dependences of reflectances of studied films measured for several angles of incidence touch the envelopes of maxima and minima of these spectral dependences. Using a simple formula containing the wavelengths mentioned one can evaluate the values of the thicknesses and spectral dependences of the refractive indices of the films analyzed.

Czech abstract

viz angl.

English abstract

A new efficient modication of the method enabling us to perform the optical characterization of non-absorbing and weakly absorbing thin films without using the absolute values of reflectances measured is presented. This modification is based on determining the values of the wavelengths corresponding to the points where the spectral dependences of reflectances of studied films measured for several angles of incidence touch the envelopes of maxima and minima of these spectral dependences. Using a simple formula containing the wavelengths mentioned one can evaluate the values of the thicknesses and spectral dependences of the refractive indices of the films analyzed.

Keywords in Czech

Tenké vrstvy, Spektrální odrazivost, Optické parametry

Keywords in English

Thin films, Spectral reflectance, Optical parameters

RIV year

2001

Released

01.01.2001

ISSN

0042-207X

Volume

61

Number

1

Pages from–to

285–289

Pages count

5

BIBTEX


@article{BUT39658,
  author="Ivan {Ohlídal} and Daniel {Franta} and Miloslav {Ohlídal} and Karel {Navrátil},
  title="Determination of thicknesses and spectral dependences of refractive indices of non-absorbing and weakly absorbing thin films using the wavelengths related to extrema in spectral reflectances",
  year="2001",
  volume="61",
  number="1",
  month="January",
  pages="285--289",
  issn="0042-207X"
}